• EmCrafts
  • SEM
  • Optional Devices
  • Optional Devices
  • EBSD
  • Bruker
  • CrystAlign EBSD Fast Facts
  • QUANTAX CrystAlign is Bruker‘s powerful, yet easy-to-use, electron backscatter diffraction (EBSD) analysis system.
    It features the unique e‑Flash detector series with excellent performance in all EBSD applications.
  • e–Flash series – technologically leading EBSD detector architecture
  • e‑Flash1000 for high speed measurements with up to 920 patterns/s, improved accuracy at 630 patterns/s using 4x4 binning
  • ƒe‑FlashHR high resolution detector featuring 1600x1200 pixels native resolution; maximum speed of 170 patterns/s at 20x20 binning
  • In-situ vertical screen positioning for best available EBSD signal
  • Ultra accurate screen positioning (< 10 μm) for residual strain applications.
  • Unique ARGUS™ imaging system
  • Sophisticated detector design ƒƒfor density contrast images of highly tilted samples.
  • for colored-coded orientation contrast images using three independent detectors.
  • with fully integrated electronics for low signal loss and brilliant images.
  • Assistants and automated
configuration for ease of use
  • Signal assistant for automatic camera setup
  • Automatic detector calibration for precise measurements
  • New indexing concept, which does not require a phase setup before launching the measurement
  • Highest speed and reliability in
acquisition and evaluation
  • ƒNow featuring Transmission Kikuchi Diffraction (TKD)
  • Real time data processing and indexing quality control provided by pattern
  • Robust indexing along grain or phase boundaries
  • ƒExclusion of unwanted sample parts from measurement through map area
  • Seamless integration with ESPRIT
EDS software
  • Simultaneous high speed EBSD pattern and complete EDS spectra acquisition possible at speeds of up to 920 patterns/s
  • Complete data re-analysis at any time, including new element and phase selection, as well as advanced phase ID
  • Unequaled software usability,
flexibility and speed
  • Offline phase ID and subsequent data re-analysis at incredibly fast speeds
    of up to 54,000 points/s
  • Fast access to all measurement and postprocessing information through easy
    switching between the two workspaces
  • Large number of different result presentation options including
    point data, maps, pole figures
  • Instant access to all data for every
measured point
  • Point inspector displays all available experimental data as well as corresponding pattern simulations
  • Unparalleled pattern simulation
  • First software containing simulation tools for a more realistic band intensity prediction
  • .Realistic simulation also provides fundamental understanding of pattern formation