• EmCrafts
  • PRODUCTS
  • SEM
  • SOFTWARE
  • OPTIONAL DEVICES
  • SUPPLIES
  • Optional Devices
  • PRODUCTS
  • Optional Devices
  • EBSD
  • EDAX
  • QuasOr EBSD
  • QuasOr EBSD | Scanning electron microscope
  • Integration
  • INTEGRATED SPECTRAL IMAGING
  • 600fps, indexed with simultaneous spectral imaging
  • QuasOr Specifications
  • Hardware
    Camera Progressive scan CCD
    Resolution 640 x 480, pixel binning at 1 x 1, 2 x 2, 4 x 4, 8 x 8
    Phosphor Square (27mm x 27mm), user replaceable
    Insert/Retract Motorized slide with full software and/or hardware control
    Indexed Pattern
    Acquisition Rate with or
    without simultaneous
    EDS and WDS
    600 indexed patterns per second (With or without simultaneous EDS and WDS)
    Detector Tube Diameter 42mm
    Operating System Microsoft Windows XP, Windows 7
    cssc
    Data Acquisition Basic, Intermediate and Advanced Level: SEM image acquisition, Simultaneous
    EBSD, EDS and WDS, Tilt corrected imaging, Choice of number of Hough lines,
    Automated pattern center calibration, Dynamic three point pattern center calibration,
    Guided setup and calibration, Kikuchi pattern saved for later reanalysis,
    user option, Pattern correction for immersion lens microscopes
    Advanced Level: Pattern correction for immersion lens microscopes
    Data Processing and
    Displays
    Basic, Intermediate and Advanced Level: Index quality map, Pattern quality map,
    HKL orientation map, UVW orientation map, Euler orientation map, Phase maps,
    X-ray map, Grain boundary axis and angle maps, Grain size analyses, Grain
    shape analysis, Grain boundary CSL and special boundary maps, Editable
    crystal database (CIF format), Misorientation line scan extractions, Single click