| Hardware |
| Camera |
Progressive scan CCD |
| Resolution |
640 x 480, pixel binning at 1 x 1, 2 x 2, 4 x 4, 8 x 8 |
| Phosphor |
Square (27mm x 27mm), user replaceable |
| Insert/Retract |
Motorized slide with full software and/or hardware control |
Indexed Pattern
Acquisition Rate with or
without simultaneous
EDS and WDS |
600 indexed patterns per second (With or without simultaneous EDS and WDS) |
| Detector Tube Diameter |
42mm |
| Operating System |
Microsoft Windows XP, Windows 7 |
| cssc |
| Data Acquisition |
Basic, Intermediate and Advanced Level: SEM image acquisition, Simultaneous
EBSD, EDS and WDS, Tilt corrected imaging, Choice of number of Hough lines,
Automated pattern center calibration, Dynamic three point pattern center calibration,
Guided setup and calibration, Kikuchi pattern saved for later reanalysis,
user option, Pattern correction for immersion lens microscopes
Advanced Level: Pattern correction for immersion lens microscopes |
Data Processing and
Displays |
Basic, Intermediate and Advanced Level: Index quality map, Pattern quality map,
HKL orientation map, UVW orientation map, Euler orientation map, Phase maps,
X-ray map, Grain boundary axis and angle maps, Grain size analyses, Grain
shape analysis, Grain boundary CSL and special boundary maps, Editable
crystal database (CIF format), Misorientation line scan extractions, Single click |
